GB/T 33826-2017
ActiveMeasurement of nanofilm thickness on glass substrate—Profilometric method
玻璃衬底上纳米薄膜厚度测量 触针式轮廓仪法
Application Summary AI generated
This standard specifies a profilometric method for measuring the thickness of nanofilms deposited on glass substrates. It is applied in quality control and research settings within the electronics, optics, and coating industries, particularly for verifying thin-film coatings on glass used in displays, solar panels, or optical filters. The method is suitable for films ranging from nanometer to micrometer thickness, using a contact stylus profilometer to scan across a step created between the film and substrate.
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