GB/T 33502-2017
ActiveSurface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）
表面化学分析 X射线光电子能谱（XPS）数据记录与报告的规范要求
Application Summary AI generated
This standard specifies the requirements for recording and reporting data obtained from X-ray photoelectron spectroscopy (XPS) analysis. It is applied in surface chemical analysis laboratories and materials research settings to ensure consistency, comparability, and traceability of XPS data across different instruments and operators. The standard is used for quality control, failure analysis, and material characterization in industries such as semiconductors, coatings, and catalysis.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.