GB/T 33236-2016
ActivePolycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method
多晶硅 痕量元素化学分析 辉光放电质谱法
Application Summary AI generated
This standard specifies a method for determining trace element impurities in polycrystalline silicon using glow discharge mass spectrometry (GDMS). It is applied in the solar photovoltaic and semiconductor industries to ensure the purity of polycrystalline silicon feedstock, which directly impacts the efficiency and reliability of solar cells and electronic devices. The method is used for quality control and material certification in manufacturing and testing laboratories.
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