GB/T 32997-2016
ActiveSurface chemical analysis—General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
表面化学分析 辉光放电发射光谱定量成分深度剖析的通用规程
Application Summary AI generated
This standard specifies the general procedures for performing quantitative compositional depth profiling of solid surfaces using glow discharge optical emission spectrometry (GD-OES). It is applied in materials science and industrial quality control contexts, such as analyzing coatings, thin films, and surface layers on metals or semiconductors, to determine elemental composition as a function of depth. The standard ensures consistent methodology for calibration, measurement, and data reporting across laboratories and manufacturing environments.
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