GB/T 32817-2016

Active

Semiconductor devices—Micro-electromechanical devices—Generic specification for MEMS

半导体器件 微机电器件 MEMS总规范

Standard Type
GBT
ICS
31.080.99
CCS
L55
Status
Active
Issue Date
2016-08-29
Implementation
2017-03-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the general requirements, quality assessment procedures, and test methods for micro-electromechanical systems (MEMS) devices. It is applied in the design, manufacturing, and procurement of MEMS components such as accelerometers, pressure sensors, and micro-mirrors used in automotive, consumer electronics, and industrial automation. The standard ensures consistent performance and reliability testing across different MEMS product types.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.