GB/T 32055-2015

Active

Microbeam analysis—Electron probe microanalysis—Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy

微束分析 电子探针显微分析 波谱法元素面分析

Standard Type
GBT
ICS
71.040.50
CCS
G04
Status
Active
Issue Date
2015-10-09
Implementation
2016-09-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the methods for conducting elemental mapping analysis using wavelength-dispersive spectroscopy (WDS) in electron probe microanalysis (EPMA). It is applied in materials science, geology, and semiconductor industries to generate high-resolution, quantitative distribution maps of elements across a sample surface. The standard ensures consistent procedures for data acquisition, calibration, and reporting in microbeam analysis laboratories.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.