GB/T 30703-2014

Active

Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction

微束分析电子背散射衍射取向分析方法导则

Standard Type

GBT

ICS

71.040.50

CCS

G04

Status

Active

Issue Date

2014-03-27

Implementation

2014-12-01

Centralized Committee

国家标准委

Issuing Authority

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard provides guidelines for measuring crystallographic orientation in materials using electron backscatter diffraction (EBSD) within a scanning electron microscope. It is applied in materials science and engineering for characterizing grain structure, texture, and phase identification in metals, ceramics, and geological samples. The standard ensures consistent methodology for orientation analysis in research, quality control, and failure analysis contexts.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.