GB/T 28893-2012
AbolishedSurface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
表面化学分析 俄歇电子能谱和X射线光电子能谱 测定峰强度的方法和报告结果所需的信息
Application Summary AI generated
This standard specifies methods for determining peak intensities in Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS), along with the information required when reporting results. It is applied in surface chemical analysis laboratories and materials research contexts where precise quantification of elemental composition and chemical states on solid surfaces is needed. The standard ensures consistency and comparability of data across different instruments and studies in industries such as semiconductor manufacturing, corrosion science, and catalysis.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.