GB/T 28634-2012
AbolishedMicrobeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
微束分析 电子探针显微分析 块状试样波谱法定量点分析
Application Summary AI generated
This standard specifies the method for quantitative point analysis of bulk specimens using wavelength dispersive X-ray spectroscopy (WDS) in electron probe microanalysis (EPMA). It is applied in materials science, geology, and metallurgy to determine the elemental composition of solid samples at microscopic points, such as analyzing mineral grains, metal alloys, or ceramic phases. The standard ensures consistent procedures for calibration, measurement, and data processing in laboratory testing environments.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.