GB/T 25185-2010
ActiveSurface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
表面化学分析 X射线光电子能谱 - 荷电控制和荷电校正方法的报告
Application Summary AI generated
This standard specifies the requirements for reporting charge control and charge correction methods used in X-ray photoelectron spectroscopy (XPS) analysis. It is applied in surface chemical analysis laboratories and materials research settings to ensure consistent documentation of how sample charging is managed and corrected, particularly for insulating or poorly conductive materials. The standard is essential for generating reproducible and comparable XPS data across different instruments and studies.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.