GB/T 25184-2010
ActiveVerification method for X-ray photoelectron spectrometers
X射线光电子能谱仪检定方法
Application Summary AI generated
This standard specifies the verification method for X-ray photoelectron spectrometers (XPS), detailing procedures for calibrating energy scale, intensity scale, and energy resolution. It is applied in chemical analysis and materials science laboratories to ensure the accuracy and reliability of XPS instruments used for surface composition and chemical state analysis. The standard is particularly relevant for quality control and research in industries such as semiconductors, catalysis, and corrosion science.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.