GB/T 21636-2008

Abolished

Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary

微束分析 电子探针显微分析 (EPMA) 术语

Standard Type
GBT
ICS
71.040.99
CCS
G04
Status
Abolished
Issue Date
2008-04-11
Implementation
2008-10-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard defines the terminology used in Electron Probe Micro Analysis (EPMA), ensuring consistent communication among professionals in materials science, geology, and semiconductor industries. It applies to laboratories and research facilities that use EPMA for quantitative elemental analysis and imaging of solid materials at the micrometer scale. The vocabulary covers instrument components, measurement principles, and data interpretation, supporting accurate reporting and comparison of results across different testing contexts.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.