GB/T 20725-2006
AbolishedElectron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
波谱法定性点分析电子探针显微分析导则
Application Summary AI generated
This standard provides guidelines for performing qualitative point analysis using wavelength dispersive X-ray spectrometry (WDS) in electron probe microanalysis (EPMA). It is applied in materials science, geology, and metallurgy to identify the elemental composition of microscopic sample regions, such as inclusions, coatings, or mineral grains. The standard ensures consistent methodology for spectral acquisition and interpretation in laboratory-based microanalysis.
Related Standards
GB/T 20724-2006
Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 28727-2012
Gas analysis - Determination of sulfides - Gas chromatograph with flame photometric detector
GB/T 14666-2003
Terms for analytical chemistry
GB/T 656-2003
Chemical reagent--Ammonium dichromate
GB/T 674-2003
Chemical reagent--Copper(II)oxide powder
GB/T 1265-2003
Chemical reagent--Sodium bromide
GB/T 606-2003
Chemical reagent--General method for the determination of water--Karl Fischer method
GB/T 19502-2004
Surface chemical analysis--Glowdischarge optical emission spectrometry(GD-OES)--Introduction to use
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.