GB/T 20521.2-2025

Upcoming

Semiconductor devices—Part 14-2: Semiconductor sensors—Hall elements

半导体器件 第14-2部分:半导体传感器 霍尔元件

Standard Type
GBT
ICS
31.080.99
CCS
L40
Status
Upcoming
Issue Date
2025-12-02
Implementation
2026-07-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家市场监督管理总局、国家标准化管理委员会

Application Summary AI generated

This standard specifies the technical requirements, test methods, and quality evaluation criteria for Hall elements used as semiconductor sensors. It is applied in the design, manufacturing, and procurement of Hall-effect sensors for applications such as position sensing, current measurement, and magnetic field detection in automotive, industrial automation, and consumer electronics. The standard ensures consistent performance and reliability across different manufacturers and testing environments.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.