GB/T 20516-2006

Active

Semiconductor devices - Discrete devices - Part 4: Microwave devices

半导体器件 分立器件 第4部分:微波器件

Standard Type
GBT
ICS
31.080.01
CCS
L40
Status
Active
Issue Date
2006-10-10
Implementation
2007-02-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the essential ratings, characteristics, and testing methods for discrete semiconductor microwave devices, such as Schottky diodes, PIN diodes, and varactors. It is applied in the design, quality assessment, and procurement of components used in high-frequency circuits, including radar systems, wireless communication equipment, and satellite transceivers. Engineers and manufacturers rely on this standard to ensure consistent performance and reliability in microwave signal processing and transmission applications.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.