GB/T 18907-2013
ActiveMicrobeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
微束分析 分析电子显微术 透射电镜选区电子衍射分析方法
Application Summary AI generated
This standard specifies the method for performing selected-area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to determine the crystal structure and phase identification of microscopic samples. It is applied in materials science, nanotechnology, and semiconductor industries for characterizing crystalline materials, such as nanoparticles, thin films, and alloys, at the nanometer scale. The standard ensures consistent and reliable diffraction pattern acquisition and interpretation in research laboratories and quality control settings.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.