GB/T 18907-2013

Active

Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

微束分析 分析电子显微术 透射电镜选区电子衍射分析方法

Standard Type
GBT
ICS
71.040.50
CCS
G04
Status
Active
Issue Date
2013-07-19
Implementation
2014-03-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the method for performing selected-area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to determine the crystal structure and phase identification of microscopic samples. It is applied in materials science, nanotechnology, and semiconductor industries for characterizing crystalline materials, such as nanoparticles, thin films, and alloys, at the nanometer scale. The standard ensures consistent and reliable diffraction pattern acquisition and interpretation in research laboratories and quality control settings.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.