GB/T 18735-2014

Active

Microbeam analysis—General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS)

微束分析 分析电镜(AEM/EDS)纳米薄标样通用规范

Standard Type
GBT
ICS
71.040.50
CCS
G04
Status
Active
Issue Date
2014-07-24
Implementation
2015-03-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard provides guidelines for specifying nanometer-thin reference materials used in analytical transmission electron microscopes equipped with energy-dispersive X-ray spectroscopy (AEM/EDS). It is applied in microbeam analysis for calibrating and validating quantitative elemental composition measurements of thin films and nanostructures. The standard ensures consistency and accuracy in materials science, semiconductor manufacturing, and nanotechnology research.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.