GB/T 14619-2013

Active

Alumina ceramic substrates for thick film integrated circuits

厚膜集成电路用氧化铝陶瓷基片

Standard Type
GBT
ICS
31.030
CCS
L90
Status
Active
Issue Date
2013-11-12
Implementation
2014-04-15
Centralized Committee
工业和信息化部(电子)
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

GB/T 14619-2013 specifies the technical requirements, test methods, inspection rules, and packaging for alumina ceramic substrates used in thick film integrated circuits. It applies to the production and quality control of substrates that serve as the base material for screen-printed conductive, resistive, and dielectric layers in hybrid microelectronics. This standard ensures dimensional stability, surface finish, and thermal properties critical for reliable circuit performance in industrial electronics and telecommunications equipment.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.