GB/T 12560-1999

Active

Semiconductor devices--Sectional specification for discrete devices

半导体器件 分立器件分规范

Standard Type
GBT
ICS
31.080.01
CCS
L40
Status
Active
Issue Date
1999-08-02
Implementation
2000-03-01
Centralized Committee
工业和信息化部（电子）
Issuing Authority
国家质量技术监督局

Application Summary AI generated

GB/T 12560-1999 provides the general quality assessment requirements and test methods for discrete semiconductor devices such as diodes, transistors, and thyristors. It is applied in the manufacturing and procurement of these components for consumer electronics, industrial equipment, and automotive systems. The standard ensures consistent reliability and performance verification across production and incoming inspection processes.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.