Browse Standards

1435+ standards in database

1435 result(s) found

GB/T 5969-2012 Active

电子设备用固定电容器 第9-1部分:空白详细规范 2类瓷介固定电容器 评定水平 EZ

Fixed capacitors for use in electronic equipment - Part 9-1: Blank detail specification:Fixed capacitor of ceramic dielectric,Class 2 - Assessment level EZ

ICS: 31.060.20
2013-02-15
GB/T 3352-2012 Active

人造石英晶体 规范与使用指南

Synthetic quartz crystal - Specifications and guide to the use

ICS: 31.140
2013-02-15
GB/T 17207-2012 Active

电子设备用固定电容器 第18-1部分:空白详细规范 表面安装固体(MnO2)电解质铝固定电容器 评定水平EZ

Fixed capacitors for use in electronic equipment - Part 18-1: Blank detail specification - Fixed aluminium electrolytic surface mount - Capacitors with solid(MnO2) electrolyte - Assessment level EZ

ICS: 31.060.50
2013-02-15
GB/T 12859.2-2012 Active

电子元器件质量评定体系规范 压电陶瓷谐振器 第2部分:分规范- 鉴定批准

Piezoelectric ceramic resonators - A specification in the IEC quality assessment System for electronic components (IECQ) - Part 2: Sectional specification-Qualification approval

ICS: 31.140
2013-02-15
GB/T 12859.201-2012 Active

电子元器件质量评定体系规范 压电陶瓷谐振器 第2-1部分:空白详细规范-评定水平E

Piezoelectric ceramic resonators - A specification in the quality assessment System for electronic components - Part 2-1: Blank detail specification-Assessment level E

ICS: 31.140
2013-02-15
GB/T 12859.1-2012 Active

电子元器件质量评定体系规范 压电陶瓷谐振器 第1部分:总规范- 鉴定批准

Piezoelectric ceramic resonators - A specification in the IEC quality assessment System for electronic components(IECQ) - Part 1: Generic specification-Qualification approval

ICS: 31.140
2013-02-15
GB/T 10190-2012 Active

电子设备用固定电容器 第16部分: 分规范 金属化聚丙烯膜介质直流固定电容器

Fixed capacitors for use in electronic equipment - Part 16: Sectional specification:Fixed metallized polypropylene film dielectric d.c.capacitors

ICS: 31.060.30
2013-02-15
GB/T 4937.3-2012 Active

半导体器件 机械和气候试验方法 第3部分:外部目检

Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination

ICS: 31.080.01
2013-02-15
GB/T 4937.4-2012 Active

半导体器件 机械和气候试验方法 第4部分:强加速稳态湿热试验(HAST)

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

ICS: 31.080.01
2013-02-15
GB/T 9532-2012 Active

压电单晶材料型号命名方法

Designations for piezoelectric crystals

ICS: 31.140
2013-02-15
GB/T 28862-2012 Active

环氧粉末包封料试样加工方法

Method for processing sample of encapsulating material of powdered epoxy

ICS: 31.020
2013-02-15
GB/T 28861-2012 Abolished

环氧粉末包封料熔融流动性试验方法

Test method for measuring melt fluidity of encapsulating material of powdered epoxy

ICS: 31.020
2013-02-15
GB/T 28860-2012 Active

环氧粉末包封料胶化时间测定方法

Test method for the determination of get time of encapsulating material of powdered epoxy

ICS: 31.020
2013-02-15
GB/T 18910.61-2012 Abolished

液晶显示器件 第6-1部分:液晶显示器件测试方法 光电参数

Liquid crystal display devices - Part 6-1: Measuring methods for liquid crystal display devices - Photoelectric parameter

ICS: 31.120
2013-02-15
GB/T 12079-2012 Active

X射线管光电性能测试方法

Measurements of the photoelectric properties for X-ray tubes

ICS: 31.100
2013-02-15
GB/T 4597-2012 Active

电子管词汇

Vocabulary of electronic tubes

ICS: 31.100
2013-02-15
GB/T 12274.1-2012 Active

有质量评定的石英晶体振荡器 第1部分:总规范

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

ICS: 31.140
2013-02-15
GB/T 12273.501-2012 Active

石英晶体元件 电子元器件质量评定体系规范 第5.1部分:空白详细规范 鉴定批准

Quartz crystal units A specification in the quality assessment system for electronic components Part 5.1: Blank detail specification- qualification approval

ICS: 31.140
2013-02-15
GB/T 18910.11-2012 Abolished

液晶显示器件 第1-1部分:术语和符号

Liquid crystal display devices - Part 1-1: Terminology and symbols

ICS: 31.120
2013-02-15
GB/T 17702-2013 Abolished

电力电子电容器

Capacitors for power electronics

ICS: 31.060.70
2013-07-01
Previous Page 32 of 72 Next