GB/T 5201-2012

Active

Test procedures for semiconductor charged particle detectors

带电粒子半导体探测器测量方法

Standard Type
GBT
ICS
27.120
CCS
F88
Status
Active
Issue Date
2012-06-29
Implementation
2012-11-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the measurement methods for the electrical and detection performance parameters of semiconductor charged particle detectors, including energy resolution, leakage current, and depletion voltage. It is primarily applied in nuclear physics experiments, radiation monitoring, and particle detection systems where silicon or germanium detectors are used to measure alpha particles, protons, or other charged particles. The standard ensures consistent testing protocols for detector qualification in research facilities, nuclear power plants, and radiation protection equipment.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.