GB/T 11685-2003

Active

Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energyspectrometers

半导体X射线探测器系统和半导体X射线能谱仪的测量方法

Standard Type
GBT
ICS
27.120.01
CCS
F80
Status
Active
Issue Date
2003-07-07
Implementation
2004-01-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局

Application Summary AI generated

This standard specifies the measurement methods for the performance parameters of semiconductor X-ray detector systems and semiconductor X-ray energy spectrometers. It is applied in the fields of nuclear instrumentation, radiation detection, and material analysis, particularly for calibrating and testing the energy resolution, detection efficiency, and linearity of these systems in laboratory and industrial settings. The standard ensures consistent and accurate characterization of equipment used in X-ray fluorescence analysis, environmental monitoring, and scientific research.

Related Standards

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.