GB/T 43226-2023
ActiveTime-domain test methods for space single event soft errors of semiconductor integrated circuit
宇航用半导体集成电路单粒子软错误时域测试方法
Application Summary AI generated
This standard specifies time-domain test methods for evaluating single-event soft errors in semiconductor integrated circuits used in space applications. It is applied to aerospace-grade ICs to assess their susceptibility to radiation-induced transient faults, ensuring reliability in satellite and spacecraft electronics. The testing context involves simulating particle strikes and measuring error rates in the time domain.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.