GB/T 36969-2018
ActiveNanotechnology—Method for the measurement of the nanofilm-thickness by atomic force microscopy
纳米技术 原子力显微术测定纳米薄膜厚度的方法
Application Summary AI generated
This standard specifies a method for measuring the thickness of nanoscale films using atomic force microscopy (AFM). It is applied in research, development, and quality control within nanotechnology, semiconductor manufacturing, and materials science, where precise thickness characterization of thin films (e.g., coatings, dielectric layers, or biological membranes) is critical for performance and reliability. The standard ensures consistent and accurate measurement procedures across laboratories and industrial settings.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.