GB/T 24468-2009

Abolished

Specification for definition and measurement of semiconductor equipment reliability, availability, and maintainability(RAM)

半导体设备可靠性、可用性和维修性(RAM)的定义和测量规范

Standard Type
GBT
ICS
17.040.30
CCS
L85
Status
Abolished
Issue Date
2009-10-15
Implementation
2009-12-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard defines the terminology, metrics, and measurement methods for assessing the reliability, availability, and maintainability (RAM) of semiconductor manufacturing equipment. It is applied by equipment manufacturers and fab operators in the semiconductor industry to evaluate tool performance, benchmark equipment, and improve production efficiency through standardized RAM data collection and analysis.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.