JB/T 54285-1999
Product Quality Grading for Measuring Tools and Instruments - Micrometer Heads
量具量仪产品质量分等 测微头
Catalogue
前言 → 1 范围 → 2 引用标准 → 3 合格品 → 4 一等品 → 5 优等品 → 6 等级评定 Foreword → 1 Scope → 2 Normative References → 3 Qualified Product → 4 First-Class Product → 5 Premium Product → 6 Grade Evaluation
Scope
This standard specifies the quality indicators for qualified products, first-class products, and premium products of micrometer heads. This standard is applicable to the evaluation of quality grades for batch-produced micrometer heads.
本标准规定了测微头的合格品、一等品和优等品的各项质量指标。 本标准适用于成批生产的测微头质量等级的评定。
Normative References
Keywords
Application Summary AI generated
Manufacturers of micrometer heads use this standard to classify product quality levels, ensuring products meet requirements for qualified, first-class, or premium grades. Quality inspection departments and users rely on this standard for quality evaluation and acceptance, ensuring precision and reliability of micrometer heads. This standard is important for improving product quality in the measuring tools and instruments industry.
测微头的生产厂家使用本标准来划分产品质量等级，确保产品符合合格品、一等品或优等品的要求。质检部门和用户依据本标准进行质量评定和验收，以保证测微头的精度和可靠性。该标准对提升量具量仪行业的产品质量水平具有重要意义。
AI Summary AI generated
This standard JB/T 54285-1999 specifies product quality grading for micrometer heads, including quality indicators for qualified, first-class, and premium products. Qualified products must meet requirements for movement deviation, external defects, and return error. First-class products add requirements for pitch error, cleanliness, and life tests. Premium products require stricter pitch error and cleanliness limits and must pass life tests. The standard applies to batch-produced micrometer heads for quality grade evaluation, under the jurisdiction of the National Technical Committee for Standardization of Measuring Tools and Instruments.
本标准JB/T 54285-1999规定了测微头的产品质量分等，包括合格品、一等品和优等品的质量指标。合格品需满足移动偏差、外部缺陷、回程误差等要求；一等品在合格品基础上增加螺距误差、清洁度和寿命试验要求；优等品则需达到更严格的螺距误差和清洁度指标，并通过寿命试验。标准适用于成批生产测微头的质量等级评定，由全国量具量仪标准化技术委员会归口。
Key Sentences extracted from text
测微头在量程范围内的移动偏差应不大于表1的规定。
测微螺杆的移动应平稳，无卡滞现象。
测微头测量面平面度公差、测量面相对测微螺杆轴线的垂直度公差见表2。
具有测力装置的测微头测量面与球面接触时的测力应为6~10 N，其测力变化应不大于2 N。
测微头清洁度不应大于表5的规定。
The movement deviation of the micrometer head within the measuring range shall not exceed the values specified in Table 1.
The movement of the micrometer screw shall be smooth, without sticking.
The flatness tolerance of the measuring face and the perpendicularity tolerance of the measuring face relative to the axis of the micrometer screw are specified in Table 2.
For micrometer heads with a measuring force device, the measuring force when the measuring face contacts a spherical surface shall be 6 to 10 N, and the variation in measuring force shall not exceed 2 N.
The cleanliness of the micrometer head shall not exceed the values specified in Table 5.
Standard Timeline
Changes from replaced version:
- 本标准与JB/T 54285—94的技术内容一致，仅按有关规定重新进行了编辑。
- The technical content of this standard is consistent with JB/T 54285-94, only re-edited according to relevant regulations.