JB/T 54282-1999
Quality Grading of Measuring Tools and Instruments Products - Micrometer (Internal Use)
量具量仪产品质量分等 微米千分尺（内部使用）
Catalogue
前言 → 1 范围 → 2 引用标准 → 3 合格品 → 4 一等品 → 5 优等品 → 6 等级评定 Foreword → 1 Scope → 2 Normative References → 3 Qualified Product → 4 First-Class Product → 5 Premium Product → 6 Grade Evaluation
Scope
This standard specifies the quality indicators for qualified products, first-class products, and premium products of micrometers. This standard is applicable to the quality grade evaluation of micrometers produced in batches.
本标准规定了微米千分尺的合格品、一等品和优等品的各项质量指标。本标准适用于成批生产的微米千分尺质量等级的评定。
Normative References
Keywords
Application Summary AI generated
Manufacturers of micrometers use this standard to evaluate the quality grade of their products, ensuring compliance with qualified, first-class, or premium levels. Quality inspection agencies and users also rely on this standard for acceptance and selection. By defining clear technical indicators, it promotes quality improvement and industry standardization for micrometers.
微米千分尺的制造商使用本标准来评定其产品的质量等级，确保产品符合合格品、一等品或优等品的要求。质检机构和用户也可依据本标准进行验收和选型。该标准通过明确各项技术指标，促进了微米千分尺质量的提升和行业规范化。
AI Summary AI generated
This standard specifies quality indicators for qualified, first-class, and premium grades of micrometers, including requirements for indication error, parallelism, measuring force, hardness, surface roughness, cleanliness, and life testing. Qualified products must meet basic performance; first-class products reduce indication error by 10% and add pitch error and cleanliness limits; premium products reduce indication error by 20% and require 100% pass rate in life tests. The standard is used for quality grade evaluation of batch-produced micrometers.
本标准规定了微米千分尺的合格品、一等品和优等品的质量指标，包括示值误差、平行度、测力、硬度、表面粗糙度、清洁度、寿命试验等要求。合格品需满足基本性能，一等品压缩示值误差10%并增加螺距误差和清洁度要求，优等品压缩示值误差20%并提高寿命试验合格率。标准适用于成批生产的微米千分尺质量等级评定。
Key Sentences extracted from text
微米千分尺的示值误差和测量面的平行度公差应不大于表1的规定。
微米千分尺测微螺杆移动应平稳，无卡滞现象，其轴向和径向间隙应不大于0.01 mm。
微米千分尺锁紧装置应能保证牢固地锁紧测微螺杆，锁紧时两测量面间距离变化应不大于0.001 mm。
将微米千分尺合格品的示值误差压缩10%。
微米千分尺进行寿命试验时，寿命要求按表6的规定。
The indication error and parallelism tolerance of the measuring faces of the micrometer shall not exceed the values specified in Table 1.
The movement of the micrometer spindle shall be smooth without sticking, and its axial and radial clearance shall not exceed 0.01 mm.
The locking device of the micrometer shall ensure firm locking of the spindle, and the change in distance between the two measuring faces when locked shall not exceed 0.001 mm.
The indication error of the qualified micrometer shall be reduced by 10%.
When the micrometer undergoes life testing, the life requirements shall comply with Table 6.
Standard Timeline
Changes from replaced version:
- 本标准与JB/T 54282—94的技术内容一致，仅按有关规定重新进行了编辑。
- The technical content of this standard is consistent with JB/T 54282-94, only re-edited according to relevant regulations.