JB/T 54275-1999
Product Quality Grading for Measuring Tools and Instruments - Small Head Micrometer (Internal Use)
量具量仪产品质量分等 小测头千分尺（内部使用）
Catalogue
前言 → 1 范围 → 2 引用标准 → 3 合格品 → 4 一等品 → 5 优等品 → 6 等级评定 Foreword → 1 Scope → 2 Normative References → 3 Qualified Product → 4 First-Class Product → 5 Premium Product → 6 Grade Evaluation
Scope
This standard specifies the quality indicators for qualified products, first-class products, and premium products of small head micrometers. This standard is applicable to the quality grade evaluation of small head micrometers produced in batches.
本标准规定了小测头千分尺的合格品、一等品和优等品的各项质量指标。本标准适用于成批生产的小测头千分尺质量等级的评定。
Normative References
Keywords
Application Summary AI generated
Manufacturers of small head micrometers use this standard to grade their products into qualified, first-class, or premium levels. Quality inspection agencies and customers rely on it for acceptance testing and selection, ensuring measurement accuracy and reliability. By defining clear quality tiers, the standard drives continuous improvement and product consistency in the industry.
小测头千分尺的制造商使用本标准来评定其产品的质量等级，确保产品符合合格品、一等品或优等品的要求。质检机构和用户依据本标准进行验收和选型，以保证测量精度和可靠性。该标准通过明确的质量分级，促进了行业内的质量提升和产品一致性。
AI Summary AI generated
This standard JB/T 54275-1999 specifies quality grading requirements for small head micrometers, covering three grades: qualified, first-class, and premium. Qualified products must meet basic requirements for indication error, parallelism, appearance, interaction, and other items. First-class products tighten indication error by 15% over qualified products and add requirements for pitch error, cleanliness, and life testing. Premium products further tighten indication error by 25%, require higher cleanliness and 100% pass rate in life tests, and mandate advanced graduation processes. Grade evaluation follows JB/T 54247.2.
本标准JB/T 54275-1999规定了小测头千分尺的质量分等要求，包括合格品、一等品和优等品三个等级。合格品需满足基本示值误差、平行度、外观、相互作用等多项指标；一等品在合格品基础上压缩示值误差15%，并增加螺距误差、清洁度和寿命试验要求；优等品进一步压缩示值误差25%，提高清洁度和寿命试验合格率至100%，并采用先进刻线工艺。等级评定按JB/T 54247.2执行。
Key Sentences extracted from text
本标准规定了小测头千分尺的合格品、一等品和优等品的各项质量指标。
小测头千分尺的示值误差和两测量面的平行度公差见表1的规定。
小测头千分尺测微螺杆移动应平稳，无卡滞现象，其轴向和径向间隙应不大于0.01 mm。
小测头千分尺测量面与球面接触时的测力为5~8 N，测力变化应不大于2 N。
小测头千分尺测微螺杆经30万次寿命试验后，其示值误差应不超过一等品规定的要求；棘轮经150万次寿命试验后，其测力和测力变化应不超过规定的要求，其合格率不低于67%。
This standard specifies the quality indicators for qualified products, first-class products, and premium products of small head micrometers.
The indication error and parallelism tolerance of the two measuring faces of the small head micrometer shall comply with the provisions of Table 1.
The movement of the micrometer screw of the small head micrometer shall be smooth without sticking, and its axial and radial clearance shall not exceed 0.01 mm.
The measuring force when the measuring face of the small head micrometer contacts the spherical surface shall be 5~8 N, and the variation in measuring force shall not exceed 2 N.
After 300,000 cycles of life test, the indication error of the micrometer screw of the small head micrometer shall not exceed the requirements specified for first-class products; after 1.5 million cycles of life test on the ratchet, its measuring force and variation in measuring force shall not exceed the specified requirements, and the pass rate shall not be less than 67%.
Standard Timeline
Changes from replaced version:
- 本标准与JB/T 54275—94的技术内容一致，仅按有关规定重新进行了编辑。
- The technical content of this standard is consistent with JB/T 54275-94, only editorial changes have been made according to relevant regulations.