GB/T 5252-2006

Abolished

Germanium monocrystal - inspection of dislocation etch pit density

锗单晶位错腐蚀坑密度测量方法

Standard Type
GBT
ICS
77.040.01
CCS
H17
Status
Abolished
Issue Date
2006-07-18
Implementation
2006-11-01
Centralized Committee
中国有色金属工业协会
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the method for measuring dislocation etch pit density in germanium monocrystals, providing a quantitative assessment of crystal lattice defects. It is applied in the metallurgy and semiconductor industries for quality control during the production and processing of germanium wafers used in infrared optics, solar cells, and high-frequency electronics. The testing context involves chemical etching of polished crystal surfaces followed by microscopic counting of etch pits to ensure material purity and structural integrity.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.