GB/T 46773-2025
UpcomingDetermination of the thermal conductivity of ultra-thin ceramic substrates—Flash method
超薄陶瓷基片导热系数试验方法 闪光法
Application Summary AI generated
This standard specifies the flash method for determining the thermal conductivity of ultra-thin ceramic substrates, typically less than 1 mm thick. It is applied in the electronics and semiconductor industries to evaluate heat dissipation performance of substrates used in LED packaging, power modules, and integrated circuits. The method ensures accurate thermal property testing for quality control and material selection in high-reliability electronic devices.
Related Standards
GB/T 6297-2002
Standard test method for differential thermal analysis of row materials of ceramic
GB/T 10811-2002
Under(in)-glaze decoration porcelain
GB/T 3534-2002
Standard testing methods for lead andcadmium release from domestic ceramic
GB/T 10815-2002
Domestic fine pottery
GB/T 10812-2002
Pierced daily-use decoration porcelain
GB/T 17991-1999
Definitions of terms relating to industrial ceramics
GB/T 4741-1999
Standard test method for bending strength of ceramic materials
GB/T 4740-1999
Standard test method for compressive resistance ceramic materials
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.