GB/T 44937.8-2025
UpcomingIntegrated circuits—Measurement of electromagnetic emissions—Part 8: Measurement of radiated emissions—IC stripeline method
集成电路 电磁发射测量 第8部分：辐射发射测量 IC带状线法
Application Summary AI generated
This standard specifies the IC stripline method for measuring radiated electromagnetic emissions from integrated circuits, defining test setups, procedures, and calibration requirements. It is applied in the electronics industry for evaluating the electromagnetic compatibility (EMC) of ICs during design validation, compliance testing, and quality assurance. The method is particularly useful for characterizing emissions from ICs in automotive, consumer electronics, and industrial control systems where radiated interference must be controlled.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.