GB/T 44937.6-2025
UpcomingIntegrated circuits—Measurement of electromagnetic emissions—Part 6: Measurement of conducted emissions—Magnetic probe method
集成电路 电磁发射测量 第6部分：传导发射测量 磁场探头法
Application Summary AI generated
This standard specifies a magnetic probe method for measuring conducted electromagnetic emissions from integrated circuits (ICs) on a printed circuit board (PCB). It is applied in the electronics industry for IC design validation, electromagnetic compatibility (EMC) testing, and compliance assessment of ICs used in consumer electronics, automotive systems, and industrial equipment. The method enables engineers to characterize high-frequency noise currents on IC pins and power rails without direct electrical contact.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.