GB/T 44937.2-2025
UpcomingIntegrated circuits—Measurement of electromagnetic emissions—Part 2: Measurement of radiated emissions—TEM cell and wideband TEM cell method
集成电路 电磁发射测量 第2部分：辐射发射测量 TEM小室和宽带TEM小室法
Application Summary AI generated
This standard specifies the use of transverse electromagnetic (TEM) and wideband TEM cells for measuring radiated electromagnetic emissions from integrated circuits. It is applied in the electronics industry for testing ICs during design validation, compliance assessment, and quality control to ensure they meet electromagnetic compatibility (EMC) limits. The method is particularly relevant for automotive, consumer electronics, and telecommunications products where IC-level emission control is critical.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.