GB/T 44181-2024
ActiveSpace environment—Method of single event upset rates prediction of semiconductor devices for space applications
空间环境 宇航用半导体器件在轨单粒子翻转率预计方法
Application Summary AI generated
This standard specifies a method for predicting the rate of single event upsets (SEUs) in semiconductor devices caused by space radiation. It is applied in the aerospace industry for evaluating the reliability and radiation tolerance of electronic components used in satellites and spacecraft during orbital missions. The prediction method helps engineers assess device performance under actual space conditions, guiding design and material selection for mission-critical systems.
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