GB/T 43967-2024
ActiveSpace environment—Test method of single event effects induced by pulsed laser of semiconductor devices for space application
空间环境 宇航用半导体器件单粒子效应脉冲激光试验方法
Application Summary AI generated
This standard specifies a test method for evaluating single event effects in semiconductor devices used in spacecraft by using pulsed laser irradiation. It is applied in the aerospace industry to simulate the effects of cosmic ray particles on electronic components, providing a ground-based alternative to costly and complex particle accelerator testing. The method helps qualify devices for reliable operation in space environments where radiation-induced errors can cause system failures.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.