GB/T 4377-2018

Active

Semiconductor integrated circuits—Measuring method of voltage regulators

半导体集成电路 电压调整器测试方法

Standard Type
GBT
ICS
31.200
CCS
L56
Status
Active
Issue Date
2018-03-15
Implementation
2018-08-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the test methods for electrical parameters of voltage regulators in semiconductor integrated circuits, including input/output voltage, load regulation, and line regulation. It is applied in the design, production, and quality inspection of voltage regulator ICs used in consumer electronics, industrial control systems, and power management modules. The standard ensures consistent testing procedures across manufacturers and testing laboratories for product verification and compliance.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.