GB/T 4377-1996

Abolished

Semiconductor integrated circuits--General principles of measuring methods of voltage regulator

半导体集成电路 电压调整器测试方法的基本原理

Standard Type
GBT
ICS
31.200
CCS
L56
Status
Abolished
Issue Date
1996-07-09
Implementation
1997-01-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家技术监督局

Application Summary AI generated

This standard specifies the fundamental principles and general testing methods for measuring the electrical parameters of voltage regulators within semiconductor integrated circuits. It is primarily applied in the electronics industry for quality inspection, design validation, and performance evaluation of voltage regulator ICs used in power management systems. The standard ensures consistent and reliable measurement practices across manufacturing and testing environments.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.