GB/T 43366-2023
ActiveGeneral specification for discrete semiconductor devices of space application
宇航用半导体分立器件通用规范
Application Summary AI generated
This standard specifies the general requirements, quality assurance, testing methods, and acceptance criteria for discrete semiconductor devices used in space applications. It is applied in the design, procurement, and qualification of components such as diodes and transistors for satellites, spacecraft, and other aerospace systems. The standard ensures these devices meet the high reliability and performance demands of the space environment, including radiation tolerance and thermal cycling.
Related Standards
GB/T 28878.1-2012
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GB/T 28878.8-2016
Specification of the rotating component in space science experiments—Part 8:Assemble
GB/T 28878.7-2016
Specification of the rotating component in space science experiments—Part 7:Reliability test
GB/T 28878.5-2016
Specification of the rotating component in space science experiments—Part 5: Motors acceptance
GB/T 28878.4-2016
Specification of the rotating component in space science experiments—Part 4:Lubrication oil acceptance
GB/T 28878.3-2016
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GB/T 28878.2-2016
Specification of the rotating component in space science experiments—Part 2: Requirements of lubrication design
GB/T 28878.6-2016
Specification of the rotating component in space science experiments—Part 6:Property testing
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.