GB/T 43024.2-2023
ActiveMeasurement techniques of piezoelectric,dielectric and electrostatic oscillators—Part 2: Phase jitter measurement method
压电、介电和静电振荡器的测量技术 第2部分:相位抖动测量方法
Application Summary AI generated
This standard specifies the phase jitter measurement method for piezoelectric, dielectric, and electrostatic oscillators. It is applied in the electronics industry for evaluating the timing stability and signal purity of oscillators used in communication systems, data transmission, and precision timing devices. The standard ensures consistent and accurate jitter testing across manufacturing and quality assurance processes.
Related Standards
GB/T 12634-1990
Test methods for electroelastic constants of piezoelectric crystals
GB/T 12633-1990
Terms for the measurements of the properties of the piezoelectric crystals
GB/T 12275-1990
The rule of type designation for quartz crystal oscillators
GB/T 11320-1989
Test methods for the properties of piezoelectric ceramics--Material with the low mechanical quality factor
GB/T 11312-1989
Test methods for SAW properties of piezoelectric ceramics and crystals
GB/T 11311-1989
Test methods for the properties of piezoelectric ceramics--Test for Poisson’s ratio σE
GB/T 11310-1989
Test methods for the properties of piezoelectric ceramics--Test methods for temperature characteristics of relative free dielectric constants
GB/T 11309-1989
Test methods for the properties of piezoelectric ceramics--Quasi-static testfor piezoelectric strain content d33
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.