GB/T 42974-2023

Active

Semiconductor integrated circuits—Flash memory(FLASH)

半导体集成电路 快闪存储器(FLASH)

Standard Type
GBT
ICS
31.200
CCS
L56
Status
Active
Issue Date
2023-09-07
Implementation
2024-01-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家市场监督管理总局、国家标准化管理委员会

Application Summary AI generated

This standard specifies the technical requirements, test methods, and quality evaluation procedures for flash memory semiconductor integrated circuits. It is applied in the design, manufacturing, and procurement of flash memory chips used in consumer electronics, data storage devices, and embedded systems. The standard ensures consistent performance and reliability testing across the industry.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.