GB/T 42969-2023
ActiveDisplacement damage test method for components
元器件位移损伤试验方法
Application Summary AI generated
This standard specifies the test methods for evaluating displacement damage effects in semiconductor components caused by particle radiation, such as neutrons and protons. It is primarily applied in the aerospace, nuclear, and high-energy physics industries to assess the reliability and performance degradation of electronic components operating in radiation environments. The standard provides procedures for measuring changes in electrical parameters like gain and leakage current before and after irradiation.
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