GB/T 42968.9-2025
ActiveIntegrated circuits—Measurement of electromagnetic immunity—Part 9: Measurement of radiated immunity—Surface scan method
集成电路 电磁抗扰度测量 第9部分：辐射抗扰度测量 表面扫描法
Application Summary AI generated
This standard specifies the surface scan method for measuring the radiated electromagnetic immunity of integrated circuits. It is applied in the electronics industry to evaluate how ICs withstand electromagnetic fields during product design and compliance testing. The method is particularly useful for identifying localized susceptibility within the IC package or die.
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