GB/T 42968.8-2023
ActiveIntegrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method
集成电路 电磁抗扰度测量 第8部分：辐射抗扰度测量 IC带状线法
Application Summary AI generated
This standard specifies the IC stripline method for measuring the radiated electromagnetic immunity of integrated circuits. It is applied in the electronics industry for testing the susceptibility of ICs to radiated electromagnetic fields, particularly during design validation and compliance assessment for automotive, industrial, and consumer electronic products. The method provides a controlled, repeatable test environment to evaluate how ICs perform under specified radio-frequency interference.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.