GB/T 42897-2023
ActiveMicro-electromechanical systems(MEMS) technology—Tensile strength test method for nano-scale membranes of silicon based MEMS
微机电系统(MEMS)技术 硅基MEMS纳米厚度膜抗拉强度试验方法
Application Summary AI generated
This standard specifies a test method for measuring the tensile strength of nano-scale membranes used in silicon-based micro-electromechanical systems (MEMS). It is applied in the semiconductor and microelectronics industries for quality control and reliability assessment of thin-film materials during MEMS device fabrication. The standard is relevant for R&D and production testing of sensors, actuators, and other MEMS components where mechanical properties at the nanoscale are critical.
Related Standards
GB/T 19403.1-2003
Semiconductor devices--Integrated circuits--Part 11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)
GB/T 17574.10-2003
Semiconductor devices--Integrated circuits--Part 2-10:Digital integrated circuits--Blank detail specification for integrated circuit dynamicread/write memories
GB/Z 43510-2023
Integrated circuit TSV 3D package reliability test methods guideline
GB/T 19248-2003
Test method for measuring the resistance of package leads
GB/T 18500.2-2001
Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 2:Blank detail specification for linear analogue-to-digital converters(ADC)
GB/T 18500.1-2001
Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 1:Blank detail specification for linear digital-to-analogue converters(DAC)
GB/T 5965-2000
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section one--Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)
GB/T 17940-2000
Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.