GB/T 42848-2023
ActiveSemiconductor intergrated circuits—Test method of direct digital frequency synthesizer
半导体集成电路 直接数字频率合成器测试方法
Application Summary AI generated
This standard specifies the test methods for direct digital frequency synthesizers (DDS) used in semiconductor integrated circuits. It is applied in the electronics industry for evaluating the performance parameters of DDS chips, such as frequency resolution, spurious-free dynamic range, and phase noise, during design verification, production testing, and quality assurance.
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