GB/T 42838-2023

Active

Semiconductor integrated circuits—Measuring method of Holzer circuit

半导体集成电路 霍尔电路测试方法

Standard Type
GBT
ICS
31.200
CCS
L56
Status
Active
Issue Date
2023-08-06
Implementation
2023-12-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家市场监督管理总局、国家标准化管理委员会

Application Summary AI generated

This standard specifies the testing methods for Hall-effect circuits in semiconductor integrated circuits, including parameters such as sensitivity, offset voltage, and magnetic field response. It is applied in the design, manufacturing, and quality inspection of Hall sensors used in automotive electronics, industrial automation, and consumer devices like position and speed detectors. The standard ensures consistent measurement procedures across laboratories and production lines for reliability and comparability.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.