GB/T 42709.7-2023
ActiveSemiconductor devices—Micro-electromechanical devices—Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
半导体器件 微电子机械器件 第7部分：用于射频控制和选择的MEMS体声波滤波器和双工器
Application Summary AI generated
This standard specifies the technical requirements, test methods, and quality assessment procedures for MEMS bulk acoustic wave (BAW) filters and duplexers used in radio frequency (RF) control and selection. It is applied in the design, manufacturing, and testing of these components for wireless communication devices, such as smartphones and base stations, to ensure reliable RF signal filtering and duplexing performance. The standard is particularly relevant for engineers and procurement professionals in the electronics industry who need to verify compliance with performance and reliability benchmarks for MEMS-based RF components.
Related Standards
GB/T 19403.1-2003
Semiconductor devices--Integrated circuits--Part 11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)
GB/T 17574.10-2003
Semiconductor devices--Integrated circuits--Part 2-10:Digital integrated circuits--Blank detail specification for integrated circuit dynamicread/write memories
GB/Z 43510-2023
Integrated circuit TSV 3D package reliability test methods guideline
GB/T 19248-2003
Test method for measuring the resistance of package leads
GB/T 18500.2-2001
Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 2:Blank detail specification for linear analogue-to-digital converters(ADC)
GB/T 18500.1-2001
Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 1:Blank detail specification for linear digital-to-analogue converters(DAC)
GB/T 5965-2000
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section one--Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)
GB/T 17940-2000
Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.