GB/T 41805-2022

Active

Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging

光学元件表面疵病定量检测方法 显微散射暗场成像法

Standard Type
GBT
ICS
81.040.01
CCS
N05
Status
Active
Issue Date
2022-10-14
Implementation
2023-05-01
Centralized Committee
中国兵器工业集团公司
Issuing Authority
国家市场监督管理总局、国家标准化管理委员会

Application Summary AI generated

This standard specifies a method for quantitatively detecting surface defects on optical components using microscopic scattering dark-field imaging. It is applied in the manufacturing and quality control of precision optics, such as lenses, mirrors, and windows, to measure scratches, digs, and other surface imperfections. The standard is used in industries like aerospace, semiconductor lithography, and high-end imaging systems where stringent surface quality is critical for performance.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.