GB/T 41033-2021
ActiveDesign requirements of radiation hardening for CMOS IC
CMOS集成电路抗辐射加固设计要求
Application Summary AI generated
This standard specifies the design requirements for radiation hardening of CMOS integrated circuits used in aircraft and aerospace systems. It covers techniques such as layout design, circuit topology, and process adjustments to mitigate single-event effects and total ionizing dose damage. The standard is applied in the development and qualification of CMOS ICs for satellites, spacecraft, and other high-altitude or orbital electronic systems.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.