GB/T 4059-2007
AbolishedPolycrystalline silicon - examination method - zone - melting on phosphorus under controlled atomosphere
硅多晶气氛区熔基磷检验方法
Application Summary AI generated
This standard specifies a method for determining phosphorus content in polycrystalline silicon using zone melting under a controlled atmosphere. It is applied in the metallurgy and semiconductor industries to evaluate the purity of silicon feedstock, particularly for solar cell and electronic-grade silicon production. The method ensures consistent quality control during manufacturing and material acceptance testing.
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